Počet záznamů: 1

Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

SYSNO ASEP	0480451
Druh ASEP	J - Článek v odborném periodiku
Zařazení RIV	J - Článek v odborném periodiku
Poddruh J	Článek ve WOS
Název	Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
Tvůrce(i)	Řeřucha, Šimon (UPT-D)_{RID, ORCID, SAI} Yacoot, A. (GB) Pham, Minh Tuan (UPT-D)_{RID, ORCID, SAI} Čížek, Martin (UPT-D)_{RID, ORCID, SAI} Hucl, Václav (UPT-D)_{RID, ORCID, SAI} Lazar, Josef (UPT-D)_{RID, ORCID, SAI} Číp, Ondřej (UPT-D)_{RID, SAI, ORCID}
Celkový počet autorů	7
Číslo článku	045204
Zdroj.dok.	Measurement Science and Technology. - : Institute of Physics Publishing - ISSN 0957-0233 Roč. 28, č. 4 (2017), s. 1-11
Poč.str.	11 s.
Forma vydání	Tištěná - P
Jazyk dok.	eng - angličtina
Země vyd.	GB - Velká Británie
Klíč. slova	optical metrology ; DBR laser diode ; frequency stabilization ; laser interferometry ; dimensional metrology ; iodine stabilization ; displacement measurement
Vědní obor RIV	BH - Optika, masery a lasery
Obor OECD	Optics (including laser optics and quantum optics)
CEP	GB14-36681G GA ČR - Grantová agentura ČR
	LO1212 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
	ED0017/01/01 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
	TE01020233 GA TA ČR - Technologická agentura ČR
Institucionální podpora	UPT-D - RVO:68081731
UT WOS	000395878200002
EID SCOPUS	85014466742
DOI	10.1088/1361-6501/aa5ab9
Anotace	We demonstrated that an iodine stabilized distributed Bragg reflector (DBR) diode based laser system lasing at a wavelength in close proximity to lambda = 633 nm could be used as an alternative laser source to the helium-neon lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on an interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano) metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.
Pracoviště	Ústav přístrojové techniky
Kontakt	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Rok sběru	2018

Počet záznamů: 1