Počet záznamů: 1  

Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

  1. 1. 0480451 - UPT-D 2018 RIV GB eng J - Článek v odborném periodiku
    Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
    Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.
    Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233
    Grant CEP: GA ČR GB14-36681G; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01; GA TA ČR TE01020233
    Institucionální podpora: RVO:68081731
    Klíčová slova: optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
    Kód oboru RIV: BH - Optika, masery a lasery
    Obor OECD: Optics (including laser optics and quantum optics)
    Impakt faktor: 1.685, rok: 2017

    We demonstrated that an iodine stabilized distributed Bragg reflector (DBR) diode based laser system lasing at a wavelength in close proximity to lambda = 633 nm could be used as an alternative laser source to the helium-neon lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on an interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano) metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.
    Trvalý link: http://hdl.handle.net/11104/0276231