Počet záznamů: 1
Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam
- 1.Dluhoš, J. - Petrenec, M. - Peřina, P. - Reinauer, F. - Kopeček, Jaromír - Hrnčíř, T. - Jiruše, J.
Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam.
Proceedings of 18th International Microscopy Congress. Prague: Czechoslovak Microscopy Society, 2014 - (Hozák, P.). ISBN 978-80-260-6721-4.
[International Microscopy Congress /18./. 07.09.2014-12.09.2014, Prague]
http://hdl.handle.net/11104/0237116
Počet záznamů: 1