Počet záznamů: 1
Application of microscopy methods for characterization of silicon nanostructures
SYS 0488809 LBL 01000a^^22220027750^450 005 20240103215905.1 017 $2 DOI 100 $a 20180405d m y slo 03 ba 101 $a eng 102 $a JP 200 1-
$a Application of microscopy methods for characterization of silicon nanostructures 215 $a 1 s. $c E 300 $a do RIV jako O 463 -1
$1 001 cav_un_epca*0488810 $1 200 1 $a Abstracts of The Sixth International Education Forum on Environment and Energy Science $v S. 1-1 $1 210 $a Tokyo $c Academy for Co-creative Education of Environment and Energy Science, Tokyo Institute of Technology $d 2017 610 $a C-AFM 610 $a Atomic force microscopy 610 $a radial junctions 610 $a nanowires 610 $a photovoltaics 610 $a silicon 700 -1
$3 cav_un_auth*0294089 $a Hývl $b Matěj $i Tenké vrstvy a nanostruktury $j Thin Films and Nanostructures $p FZU-D $w Thin Films and Nanostructures $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0287362 $a Müller $b Martin $i Tenké vrstvy a nanostruktury $j Thin Films and Nanostructures $p FZU-D $w Thin Films and Nanostructures $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0219477 $a Foldyna $b M. $y CZ 701 -1
$3 cav_un_auth*0294094 $a Roca i Cabarrocas $b P. $y FR 701 -1
$3 cav_un_auth*0100196 $a Fejfar $b Antonín $i Tenké vrstvy a nanostruktury $j Thin Films and Nanostructures $p FZU-D $w Thin Films and Nanostructures $T Fyzikální ústav AV ČR, v. v. i.
Počet záznamů: 1