A combined in situ RAS, in vacuo XPS and ab initio DFT study of the GaP/Si(100) heterointerface

Supplie, O., May, M.M., Romanyuk, O., Grosse, F., Höhn, C., Steinbach, G., Stange, H., Nägelein, A., Müller, A., Kleinschmidt, P., Brückner, S., Hannappel, T. A combined in situ RAS, in vacuo XPS and ab initio DFT study of the GaP/Si(100) heterointerface. In: International Conference on Internal Interfaces (ICII-2016). Program and Abstracts. Marburg: Philipps Universität Marburg, 2016, s. 94.