A combined in situ RAS, in vacuo XPS and ab initio DFT study of the GaP/Si(100) heterointerface

SUPPLIE, O., MAY, M.M., ROMANYUK, O., GROSSE, F., HÖHN, C., STEINBACH, G., STANGE, H., NÄGELEIN, A., MÜLLER, A., KLEINSCHMIDT, P., BRÜCKNER, S., HANNAPPEL, T. A combined in situ RAS, in vacuo XPS and ab initio DFT study of the GaP/Si(100) heterointerface. In: International Conference on Internal Interfaces (ICII-2016). Program and Abstracts. Marburg: Philipps Universität Marburg, 2016, s. 94.