Application of microscopy methods for characterization of silicon nanostructures

HÝVL, Matěj, MÜLLER, Martin, FOLDYNA, M., ROCA I CABARROCAS, P., FEJFAR, Antonín. Application of microscopy methods for characterization of silicon nanostructures. In: Abstracts of The Sixth International Education Forum on Environment and Energy Science. Tokyo: Academy for Co-creative Education of Environment and Energy Science, Tokyo Institute of Technology, 2017, s. 1-1.