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A combined in situ RAS, in vacuo XPS and ab initio DFT study of the GaP/Si(100) heterointerface
- 1.SUPPLIE, O., MAY, M.M., ROMANYUK, Olexandr, GROSSE, F., HÖHN, C., STEINBACH, G., STANGE, H., NÄGELEIN, A., MÜLLER, A., KLEINSCHMIDT, P., BRÜCKNER, S., HANNAPPEL, T. A combined in situ RAS, in vacuo XPS and ab initio DFT study of the GaP/Si(100) heterointerface. In: International Conference on Internal Interfaces (ICII-2016). Program and Abstracts. Marburg: Philipps Universität Marburg, 2016, s. 94.
Počet záznamů: 1