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Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold
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SYSNO 0489644 Title Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold Author(s) Makhotkin, I.A. (NL)
Sobierajski, R. (PL)
Chalupský, J. (CZ)
Tiedtke, K. (DE)
de Vries, G. (NL)
Stoermer, M. (DE)
Scholze, F. (DE)
Siewert, F. (DE)
van de Kruijs, R.W.E. (NL)
Louis, E. (NL)
Jacyna, I. (PL)
Jurek, M. (PL)
Klinger, D. (PL)
Nittler, L. (PL)
Syryanyy, Y. (PL)
Juha, Libor (UFP-V) [LP] ORCID
Hájková, V. (CZ)
Vozda, V. (CZ)
Burian, Tomáš (UFP-V) [LP] ORCID
Saksl, K. (SK)
Faatz, B. (DE)
Keitel, B. (DE)
Ploenjes, E. (DE)
Schreiber, S. (DE)
Toleikis, S. (DE)
Loch, R. (DE)
Hermann, M. (DE)
Strobel, S. (DE)
Nienhuys, H.-K. (NL)
Gwalt, G. (DE)
Mey, T. (DE)
Enkisch, H. (DE)Corespondence/senior Makhotkin, I.A. - Korespondující autor Source Title Journal of Synchrotron Radiation. Roč. 25, č. 1 (2018), s. 77-84. - : Oxford Blackwell Conference Workshop on FEL Photon Diagnostics, Instrumentation and Beamline Design (PhotonDiag2017), 01.05.2017 - 03.05.2017, Stanford Document Type Článek v odborném periodiku Grant GA14-29772S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic LG15013 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UFP-V - RVO:61389021 Language eng Country DK Keywords free-electron laser induced damage * EUV optics * thin films * FELs Permanent Link http://hdl.handle.net/11104/0284055
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