Počet záznamů: 1
Coupled Electromagnetic-Thermal Analysis of Selected Power Semiconductor Devices
- 1.0195546 - UE-C 20023015 RIV PL eng C - Konferenční příspěvek (zahraniční konf.)
Doležel, Ivo - Barglik, J. - Ulrych, B. - Valouch, Viktor
Coupled Electromagnetic-Thermal Analysis of Selected Power Semiconductor Devices.
Electromagnetic Phenomena in Nonlinear Circuits. Poznaň: PTETiS Publishers, 2002, s. 211-214. ISBN 83-906074-5-X.
[Symposium Electromagnetic Phenomena in Nonlinear Circuits /17./. Leuven (BE), 01.07.2002-03.07.2002]
Grant CEP: GA ČR GA102/01/0182
Klíčová slova: Coupled electromagnetic-thermal analysis * power semiconductor devices
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
The paper deals with the coupled electromagnetic-thermal analysis of selected power semiconductor devices in various operation regimes. The mathematical model of the problem consists of two second-order partial differential equations with temperature-dependent coefficients describeng the distribution of the non-stationary current and temperature fields within the device.
Trvalý link: http://hdl.handle.net/11104/0091212
Počet záznamů: 1