Počet záznamů: 1
Depth profiles of As atoms implanted into Ti and .Ti02
- 1.Hnatowicz, V., Kvítek, J., Havránek, V., Peřina, V., Švorčík, V., Rybka, V. Depth profiles of As atoms implanted into Ti and .Ti02. Radiation Effects and Defects in Solids. 1994, 128(-), 167-173. ISSN 1042-0150. E-ISSN 1029-4953.
Počet záznamů: 1