Thiam, Michel Malick - Bastl, Zdeněk
Angle Resolved X-ray Photoelectron Spectroscopy Study of Pd/NbOx/Nb Interfaces.
Surface Science. 507-510, - (2002), s. 678-682. ISSN 0039-6028. E-ISSN 1879-2758
Grant CEP: GA ČR GA202/99/1714; GA ČR GV202/98/K002
Impakt faktor: 2.140, rok: 2002
http://hdl.handle.net/11104/0077935