0181353 - UFCH-W 20020008 RIV NL eng J - Článek v odborném periodiku
Thiam, Michel Malick - Bastl, Zdeněk
Angle Resolved X-ray Photoelectron Spectroscopy Study of Pd/NbOx/Nb Interfaces.
Surface Science. 507-510, - (2002), s. 678-682. ISSN 0039-6028. E-ISSN 1879-2758
Grant CEP: GA ČR GA202/99/1714; GA ČR GV202/98/K002
Výzkumný záměr: CEZ:AV0Z4040901
Klíčová slova: photoelectron spectroscopy * palladium * metallic films
Kód oboru RIV: CF - Fyzikální chemie a teoretická chemie
Impakt faktor: 2.140, rok: 2002

The thermal stability of ultrathin palladium overlayers deposited at room temperature onto oxidized niobium has been studied by high resolution angle-resolved X-ray photoelectron spectroscopy. Inward diffusion of Pd followed by formation of intermetallic phase at NbOx/Nb interface was found to occur at temperatures above 600 K. This finding explains the observation of a large decrease of adsorption capacity of Pd/NbOx/Nb samples towards carbon monoxide caused by their annealing.
Trvalý link: http://hdl.handle.net/11104/0077935