Deineka, Alexander - Jastrabík, Lubomír - Soukup, Ladislav
Ellipsometry non-destructive technique for PZT thin films investigations.
Jemná mechanika a optika. 11-12, - (2000), s. 329-331. ISSN 0447-6441
Grant CEP: GA MŠMT LN00A015
http://hdl.handle.net/11104/0031308