0133333 - FZU-D 20010128 RIV CZ eng J - Článek v odborném periodiku
Deineka, Alexander - Jastrabík, Lubomír - Soukup, Ladislav
Ellipsometry non-destructive technique for PZT thin films investigations.
Jemná mechanika a optika. 11-12, - (2000), s. 329-331. ISSN 0447-6441
Grant CEP: GA MŠMT LN00A015
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: PZT * J.A. Wollam spectral ellipsometer * refractive index depth profiels
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Thin PZT perovskire/pyrochlore stacks were studied with a J. A. Wollam spectral ellipsometer. The refractive index depth profiles were calculated from ellipsometric data. The "graded layer" model with functional dependence of refractive index was used.
Trvalý link: http://hdl.handle.net/11104/0031308