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Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
- 1.Rezek, B., Stuchlík, J., Fejfar, A., Kočka, J. Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution. Applied Physics Letters. 1999, 74(-), 1475-1477. ISSN 0003-6951. E-ISSN 1077-3118.
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