Zavadil, J., Žďánský, K., Procházková, O., Kozak, H. Characterization of InP epitaxial layers for use in radiation detection. In: OSVALD, J., HAŠČÍK, Š., eds. ASDAM'2004. Proceedings of the Fifth International Conference on Advanced Semiconductor Devices and Microsystems. Piscataway: IEEE, 2004, s. 247-250. ISBN 0-7803-8535-7.