Počet záznamů: 1
Study of indium phosphide wafers treated by long time annealing at high temperatures
- 1.Žďánský, Karel - Pekárek, Ladislav - Hlídek, P.
Study of indium phosphide wafers treated by long time annealing at high temperatures.
European Physical Journal-Applied Physics. Roč. 27, 1/3 (2004), s. 197-200. ISSN 1286-0042. E-ISSN 1286-0050.
[DRIP /10./. Batz-sur-Mer, 29.09.2003-02.10.2003]
Grant CEP: GA AV ČR IBS2067354
Impakt faktor: 0.745, rok: 2004
http://hdl.handle.net/11104/0013063
Počet záznamů: 1