Defect studies of Mg films deposited on various substrates

0476827 - FZÚ 2018 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Hruška, P. - Čížek, J. - Anwand, W. - Bulíř, Jiří - Drahokoupil, Jan - Stráská, J. - Melikhova, O. - Procházka, I. - Lančok, Ján
Defect studies of Mg films deposited on various substrates.
Journal of Physics Conference Series. Vol. 674. Bristol: IOP Publishing, 2016, s. 1-6, č. článku 012024. ISSN 1742-6588.
[International Workshop on Positron Studies of Defects 2014 (PSD 2014). Kyoto (JP), 14.09.2014-19.09.2014]
Grant CEP: GA ČR GBP108/12/G043
Institucionální podpora: RVO:68378271
Klíčová slova: magnesium films * defects * positron annihilation
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)

In the present work the structure of Mg films deposited by RF magnetron sputtering was characterized using variable energy positron annihilation spectroscopy combined with scanning electron microscopy and X-ray diffraction. The effect of deposition parameters, namely temperature, type of substrate and deposition rate, on the microstructure was examined. All Mg films studied grow with the basal (0001) plane parallel with the substrate and exhibit only negligible in-plane stress. Films deposited at room temperature are characterized by nanocrystalline structure with high volume fraction of grain boundaries. and positrons are preferentially trapped in open volume defects present at grain boundaries. In these films positrons are trapped predominantly in open-volume defects present at grain boundaries.
Trvalý link: http://hdl.handle.net/11104/0273240