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Limitations of structural insight into ultrafast melting of solid materials with X-ray diffraction imaging
- 1.0545283 - FZÚ 2022 RIV CH eng J - Článek v odborném periodiku
Tkachenko, V. - Abdullah, M.M. - Jurek, Z. - Medvedev, Nikita - Lipp, V. - Makita, M. - Ziaja, B.
Limitations of structural insight into ultrafast melting of solid materials with X-ray diffraction imaging.
Applied Sciences-Basel. Roč. 11, č. 11 (2021), č. článku 5157. E-ISSN 2076-3417
Grant CEP: GA MŠMT LTT17015
GRANT EU: European Commission(XE) 654148 - LASERLAB-EUROPE
Institucionální podpora: RVO:68378271
Klíčová slova: atomic-scale visualization * transitions * diamond * X-rays * FELs * non-thermal melting
Obor OECD: Fluids and plasma physics (including surface physics)
Impakt faktor: 2.838, rok: 2021
Způsob publikování: Open access
In this work, we analyze the application of X-ray diffraction imaging techniques to follow ultrafast structural transitions in solid materials using the example of an X-ray pump–X-ray probe experiment with a single-crystal silicon performed at a Linac Coherent Light Source. Due to the spatially non-uniform profile of the X-ray beam, the diffractive signal recorded in this experiment included contributions from crystal parts experiencing different fluences from the peak fluence down to zero. With our theoretical model, we could identify specific processes contributing to the silicon melting in those crystal regions, i.e., the non-thermal and thermal melting whose occurrences depended on the locally absorbed X-ray doses.
Trvalý link: http://hdl.handle.net/11104/0322015
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