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Humidity sensitivity of large area silicon sensors: Study and implications

  1. 1.
    0540420 - FZÚ 2021 RIV NL eng J - Článek v odborném periodiku
    Fernandez-Tejero, J. - Allport, P.P. - Avino, O. - Dette, K. - Fadeyev, V. - Fleta, C. - Gillberg, D. - Gonella, L. - Hara, K. - Helling, C. - Hommels, B. - Keller, J. - Klein, C. - Koffas, T. - Latoňová, Věra - Mikeštíková, Marcela - Orr, R. S. - Pyatt, S. - Scharf, C. - Soldevila, U. - Staats, E. - Thomas, J. - Ullan, M. - Unno, Y. - Vellvehi, M. - Wada, S.
    Humidity sensitivity of large area silicon sensors: Study and implications.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 978, Oct (2020), s. 1-6, č. článku 164406. ISSN 0168-9002. E-ISSN 1872-9576
    Grant CEP: GA MŠk(CZ) LM2018104; GA MŠk(CZ) LTT17018
    Institucionální podpora: RVO:68378271
    Klíčová slova: large area silicon sensors * slim-edge * HL-LHC
    Kód oboru RIV: BF - Elementární částice a fyzika vys. energií
    Obor OECD: Particles and field physics
    Impakt faktor: 1.455, rok: 2020
    https://doi.org/10.1016/j.nima.2020.164406

    The production of large area sensors is one of the main challenges that the ATLAS collaboration faces for the new Inner-Tracker full-silicon detector. During the prototype fabrication phase for the High Luminosity Large Hadron Collider upgrade, several ATLAS institutes observed indications of humidity sensitivity of large area sensors, even at relative humidities well below the dew point. Specifically, prototype Barrel and End-Cap silicon strip sensors fabricated in 6-inch wafers manifest a prompt decrease of the breakdown voltage when operating under high relative humidity, adversely affecting the performance of the sensors. In addition to the investigation of these prototype sensors, a specific fabrication batch with special passivation is also studied, allowing for a deeper understanding of the responsible mechanisms. This work presents an extensive study of this behaviour on large area sensors.

    Trvalý link: http://hdl.handle.net/11104/0318032

     
     
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