0470931 - FZÚ 2017 RIV GB eng J - Článek v odborném periodiku
Ondráček, Martin - Hapala, Prokop - Jelínek, Pavel
Charge-state dynamics in electrostatic force spectroscopy.
Nanotechnology. Roč. 27, č. 27 (2016), 1-13, č. článku 274005. ISSN 0957-4484. E-ISSN 1361-6528
Grant CEP: GA ČR(CZ) GA14-02079S
Institucionální podpora: RVO:68378271
Klíčová slova: atomic force microscopy * electron tunneling * redox nanoswitches * electrostatic force spectroscopy
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 3.440, rok: 2016 ; AIS: 0.913, rok: 2016
DOI: https://doi.org/10.1088/0957-4484/27/27/274005

We present a numerical model that allows us to study the response of an oscillating probe in electrostatic force spectroscopy to charge switching in quantum dots at various time scales. The model provides more insight into the behavior of frequency shift and dissipated energy under different scanning conditions when measuring a temporarily charged quantum dot on a surface. Namely, we analyze the dependence of the frequency shift, the dissipated energy, and their fluctuations on the resonance frequency of the tip and on the electron tunneling rates across the tip-quantum dot and quantum dot-sample junctions. We discuss two complementary approaches to simulating the charge dynamics, a stochastic and a deterministic one. In addition, we derive analytic formulas valid for small amplitudes, describing relations between the frequency shift, dissipated energy, and the characteristic rates driving the charging and discharging processes.
Trvalý link: http://hdl.handle.net/11104/0268432