Počet záznamů: 1  

Prospective scintillators for low-energy BSE detectors

  1. 1.
    0465106 - ÚPT 2017 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
    Lalinský, Ondřej - Schauer, Petr - Kučera, M. - Lučeničová, Z. - Hanuš, M.
    Prospective scintillators for low-energy BSE detectors.
    EMC2016. The 16th European Microscopy Congress. Proceedings. Oxford: Wiley, 2016, s. 1160-1161. ISBN 9783527808465.
    [EMC2016. European Microscopy Congress /16./. Lyon (FR), 28.08.2016-02.09.2016]
    Grant CEP: GA TA ČR(CZ) TE01020118; GA ČR(CZ) GA16-05631S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institucionální podpora: RVO:68081731
    Klíčová slova: BSE detector * cathodoluminescence * epitaxial layer * GAGG:Ce * low energy electron * scintillator
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    http://onlinelibrary.wiley.com/doi/10.1002/9783527808465.EMC2016.6239/pdf

    Cerium activated bulk single crystals of yttrium aluminium garnet (YAG:Ce) Cex:Y3-xAl5O12 are widely used as scintillators for the detection of backscattered electrons (BSE). In the electron microscopy research of nanomaterials, biomaterials or semiconductors, low energy (units of keV) electron beam imaging is often necessary. Because BSE detectors are mostly non-accelerating or low-accelerating, electrons with approximately the same energy as primary beam (PB) have to be detected. However, commonly used YAG:Ce single crystal strongly loses its light yield (LY) with the decrease of the PB energy. As possible available alternatives for this application, bulk single crystals of YAlO3:Ce (YAP:Ce) and CRY018 can be predicted. However, similar LY sink can be expected also with these scintillators.
    There are two main reasons, why this occurs. Firstly, slower electrons don’t have enough energy to pass through the relatively thick conductive layer on the scintillator surface. Therefore, thinner conductive layer has to be used. Secondly, commonly available scintillators suffer from structural defects that are created mostly due to surface damage (as a result of its grinding, polishing, purification or contamination) or already during the own bulk single crystal growth.

    Trvalý link: http://hdl.handle.net/11104/0263897

     
     
Počet záznamů: 1  

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