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On the Potential Application of the Wrinkled SiGe/SiGe Nanofilms

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    0458793 - ÚT 2017 RIV US eng J - Článek v odborném periodiku
    Fedorchenko, Alexander I. - Cheng, H. H. - Wang, W. - Ch.
    On the Potential Application of the Wrinkled SiGe/SiGe Nanofilms.
    World Journal of Mechanics. Roč. 6, č. 2 (2016), s. 19-23. ISSN 2160-049X
    Institucionální podpora: RVO:61388998
    Klíčová slova: wrinkled SiGe nanofilms * terahertz radiation * terahertz gap
    Kód oboru RIV: BE - Teoretická fyzika
    http://www.scirp.org/journal/wjm,http://dx.doi.org/10.4236/wjm.2016.62003

    Terahertz radiation (THzR) consists of electromagnetic waves within the band of frequencies from 0.3 to 3 terahertz with the wavelengths of radiation in the range from 0.1 mm to 1 mm, respe c- tively. The technology for generating and manipulating THzR is still in its initial stage. Herein, we demonstrate that the wrinkled Si 1 – x Ge x /Si 1 – y Ge y films can be used as radiation sources, which emit electromagnetic waves (EMW) in a very wide range of the frequencies including the terahertz band from 0.3 to 3 THz and far IR from 3 THz to 20 THz. These findings provide the theoretical foundation for the wrinkled nanofilm radiation emission and may allow, to some extent, to fill the terahertz gap.
    Trvalý link: http://hdl.handle.net/11104/0259976

     
     
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