Počet záznamů: 1  

Mechanism of high-resolution STM/AFM imaging with functionalized tips

  1. 1.
    0432397 - FZU-D 2015 RIV US eng J - Článek v odborném periodiku
    Hapala, Prokop - Kichin, G. - Wagner, C. - Tautz, F.S. - Temirov, R. - Jelínek, Pavel
    Mechanism of high-resolution STM/AFM imaging with functionalized tips.
    Physical Review. B. Roč. 90, č. 8 (2014), "085421-1"-"085421-9". ISSN 1098-0121
    Grant CEP: GA ČR(CZ) GC14-16963J
    Grant ostatní:AVČR(CZ) M100101207
    Institucionální podpora: RVO:68378271
    Klíčová slova: AFM * STM * high resolution
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 3.736, rok: 2014

    High-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing.We present a numerical STM/AFM model, which takes into account the relaxation of the probe due to the tip-sample interaction.
    Trvalý link: http://hdl.handle.net/11104/0236765