Počet záznamů: 1  

Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM

  1. 1.
    0421779 - ÚPT 2014 RIV US eng J - Článek v odborném periodiku
    Hrubanová, Kamila - Nebesářová, Jana - Růžička, F. - Dluhoš, J. - Krzyžánek, Vladislav
    Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM.
    Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 226-227. ISSN 1431-9276
    Grant CEP: GA MŠk EE.2.3.20.0103; GA TA ČR TE01020118; GA ČR GAP205/11/1687
    Institucionální podpora: RVO:68081731 ; RVO:60077344
    Klíčová slova: yeast biofilm * cryo-SEM * FIB-SEM
    Kód oboru RIV: BH - Optika, masery a lasery
    Impakt faktor: 2.161, rok: 2013

    Yeasts like Candida parapsilosis as well as Candida albicans has been recently recognized as an important cause of serious biofilm infections associated with implanted medical devices. The multi-layered biofilms formed by these microorganisms were observed by cryo-scanning electron microscope (cryo-SEM) with using freeze-fracturing technique and by focused ion beam scanning electron microscopy (FIB-SEM). Both imaging methods are compared.
    Trvalý link: http://hdl.handle.net/11104/0228043