Počet záznamů: 1  

Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films

  1. 1.
    0392014 - FZU-D 2014 RIV GB eng J - Článek v odborném periodiku
    Aulika, I. - Mergen, S. - Bencan, A. - Zhang, Q. - Dejneka, Alexandr - Kosec, M. - Kundzins, K. - Demarchi, D. - Civera, P.
    Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films.
    Advances in Applied Ceramics. Roč. 112, č. 1 (2013), s. 53-58. ISSN 1743-6753
    Grant CEP: GA TA ČR TA01010517; GA ČR GAP108/12/1941
    Výzkumný záměr: CEZ:AV0Z10100522
    Klíčová slova: compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 1.107, rok: 2013

    This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.
    Trvalý link: http://hdl.handle.net/11104/0220997