Počet záznamů: 1
Electrical Analogy to an Atomic Force Microscope
- 1.0350413 - ÚFE 2011 RIV CZ eng J - Článek v odborném periodiku
Kučera, Ondřej
Electrical Analogy to an Atomic Force Microscope.
Radioengineering. Roč. 19, č. 1 (2010), s. 168-171. ISSN 1210-2512
Výzkumný záměr: CEZ:AV0Z20670512
Klíčová slova: atomic force microscopy
Kód oboru RIV: JB - Senzory, čidla, měření a regulace
Impakt faktor: 0.503, rok: 2010
Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.
Trvalý link: http://hdl.handle.net/11104/0190426
Počet záznamů: 1