0185150 - UJF-V 20000324 RIV DK eng J - Článek v odborném periodiku
Tanaka, I. - Niimura, N. - Mikula, Pavol
An elastically Bent silicon monochromator for a neutron diffractometer.
Journal of Applied Crystallography. Roč. 32, - (1999), s. 525-529. ISSN 0021-8898. E-ISSN 1600-5767
Grant CEP: GA ČR GV202/97/K038; GA AV ČR KSK1048601
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 1.901, rok: 1999

A new type of elastically bent perfect Si (EBP-Si) monochromator for a neutron diffractometer, dedicated to protein crystallography, has been developed and successfully applied to two such diffractometers. I propose the following sentence: It was experimentally demonstrated that using a focusing effect as well as an increase of the effective mosaicity of an optimally EBP-Si monochromator, flux density ofmonochromatic neutrons at the sample position has been substantially increased. A specifically designed bender for the EBP-Si, which has already been applied to several diffractometers, is described. The distinctive features of the EBP-Si are summarized.
Trvalý link: http://hdl.handle.net/11104/0002055