0134417 - FZU-D 20030317 RIV DE eng J - Článek v odborném periodiku
Kromka, A. - Kravets, Roman - Poruba, Aleš - Zemek, Josef - Peřina, Vratislav - Rosa, Jan - Vaněček, Milan
Detection of residual molybdenum impurity in CVD diamond.
Physica Status Solidi A. Roč. 199, č. 1 (2003), s. 108-112. ISSN 0031-8965
Grant CEP: GA ČR GA202/02/0218
GRANT EU: European Commission(XE) HPRN-CT-1999-00139
Výzkumný záměr: CEZ:AV0Z1048901; CEZ:AV0Z1010914
Klíčová slova: Raman scattering * Rutherford backscattering * Raman spectroscopy
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 0.950, rok: 2003

Raman scattering, X-ray photoemission spectroscopy(XPS), Fourier transform photocurrent spactroscopy(FTPS), Rutherford backscattering(RBS) and electron paramagnetic(EPR) method have been used for characterization of diamond layers deposited by microwave plasma enhanced chemical vapor deposition(MWPECVD).
Trvalý link: http://hdl.handle.net/11104/0032320