0134410 - FZU-D 20030310 RIV US eng J - Článek v odborném periodiku
Rezek, Bohuslav - Saurer, C. - Garrido, J. A. - Nebel, C. E. - Stutzmann, M. - Snidero, E. - Bergonzo, P.
Scribing into hydrogenated diamond surfaces using atomic force microscopy.
Applied Physics Letters. Roč. 82, č. 19 (2003), s. 3336-3338. ISSN 0003-6951. E-ISSN 1077-3118
GRANT EU: European Commission(XE) HPRN-CT-1999-00139
Grant ostatní: DFG(DE) NE524-2
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: atomic force microscopy(AFM) * surface termination of hydrogenated diamond * microscopic patterns
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 4.049, rok: 2003

Using negatively biased silicon cantilevers, microscopic patterns can be scribed into a diamond surface, up to depth of 3 nm. The inscribed patterns exhibit different electronic properties to the rest of surface, namely electron affinity and conductivity.
Trvalý link: http://hdl.handle.net/11104/0032313