0133268 - FZU-D 20010061 RIV CZ eng J - Článek v odborném periodiku
Keprt, Jiří - Bartoněk, L.
Measurement of thin films by computr processed video-signal.
Acta Universitatis Palackianae Olomucensis Facultas Rerum Naturalium. Roč. 39, - (2000), s. 139-159. ISSN 0231-9365
Grant CEP: GA MŠMT LN00A015
Výzkumný záměr: CEZ:AV0Z1010921
Kód oboru RIV: BH - Optika, masery a lasery

The interferometrical measuring method of the optical thickness of thin films is presented in this report. The measurement of optical thickness of layers is realized by Michelson's interferometer and CCD camera.
Trvalý link: http://hdl.handle.net/11104/0031249