Počet záznamů: 1

Multiple Probe Photonic Force Microscopy

  1. 1.
    0368828 - UPT-D 2012 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
    Jákl, Petr - Šerý, Mojmír - Zemánek, Pavel
    Multiple Probe Photonic Force Microscopy.
    NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 682-687. ISBN 978-80-87294-27-7.
    [NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
    Grant CEP: GA MŠk(CZ) LC06007; GA MŠk ED0017/01/01
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: photonic force microscopy * scanning probe microscopy * two-photon fluorescence * time-sharing traps
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

    Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance.
    Trvalý link: http://hdl.handle.net/11104/0203061