Počet záznamů: 1

Spot size characterization of focused non-Gaussian X-ray laser beams

  1. 1.
    0359300 - FZU-D 2012 RIV US eng J - Článek v odborném periodiku
    Chalupský, Jaromír - Krzywinski, J. - Juha, Libor - Hájková, Věra - Cihelka, Jaroslav - Burian, Tomáš - Vyšín, Luděk - Gaudin, J. - Gleeson, A. - Jurek, M. - Khorsand, A.R. - Klinger, D. - Wabnitz, H. - Sobierajski, R. - Störmer, M. - Tiedtke, K. - Toleikis, S.
    Spot size characterization of focused non-Gaussian X-ray laser beams.
    Optics Express. Roč. 18, č. 26 (2010), s. 27836-27845 ISSN 1094-4087
    Grant CEP: GA AV ČR KAN300100702; GA MŠk LC510; GA MŠk(CZ) LC528; GA ČR GAP208/10/2302; GA MŠk LA08024; GA AV ČR IAAX00100903; GA MŠk(CZ) ME10046
    Výzkumný záměr: CEZ:AV0Z10100523
    Klíčová slova: X-ray laser * free-electron laser * beam characterization * ablation
    Kód oboru RIV: BH - Optika, masery a lasery
    Impakt faktor: 3.749, rok: 2010

    We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.
    Trvalý link: http://hdl.handle.net/11104/0197107