Počet záznamů: 1

Development of EOD for the design in electron and ion microscopy

  1. 1.
    0358560 - UPT-D 2012 RIV NL eng J - Článek v odborném periodiku
    Zlámal, J. - Lencová, Bohumila
    Development of EOD for the design in electron and ion microscopy.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 654, č. 1 (2011), s. 278-282 ISSN 0168-9002
    Grant CEP: GA AV ČR IAA100650805
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: finite element method * tolerancing * user interface
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    Impakt faktor: 1.207, rok: 2011

    The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.
    Trvalý link: http://hdl.handle.net/11104/0196559