Počet záznamů: 1

Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon

  1. 1.
    0354945 - FZU-D 2011 RIV CH eng J - Článek v odborném periodiku
    Verveniotis, Elisseos - Rezek, Bohuslav - Šípek, Emil - Stuchlík, Jiří - Kočka, Jan
    Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon.
    Thin Solid Films. Roč. 518, č. 21 (2010), s. 5965-5970 ISSN 0040-6090
    Grant CEP: GA ČR GD202/09/H041; GA MŠk(CZ) LC06040; GA AV ČR KAN400100701; GA MŠk LC510
    Výzkumný záměr: CEZ:AV0Z10100521
    Klíčová slova: amorphous materials * atomic force microscopy (AFM) * conductivity * crystallization * nanostructures * silicon * nickel
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 1.909, rok: 2010

    Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions.
    Trvalý link: http://hdl.handle.net/11104/0193834