Počet záznamů: 1

Optical and structural study of BST multilayers

  1. 1.
    0354496 - FZU-D 2011 RIV RO eng J - Článek v odborném periodiku
    Železný, Vladimír - Chvostová, Dagmar - Pajasová, Libuše - Jelínek, Miroslav - Kocourek, Tomáš - Daniš, S. - Valvoda, V.
    Optical and structural study of BST multilayers.
    Journal of Optoelectronics and Advanced Materials. Roč. 12, č. 3 (2010), 538-541 ISSN 1454-4164
    Grant CEP: GA ČR GA202/07/0591
    Výzkumný záměr: CEZ:AV0Z10100522; CEZ:AV0Z10100520
    Klíčová slova: ellipsometry * structure * ferroelectric multilayers
    Kód oboru RIV: BH - Optika, masery a lasery
    Impakt faktor: 0.412, rok: 2010

    Ba0.75Sr0.25TiO3/SrTiO3 multilayers were grown by plasma laser deposition on platinized silicon. Their total thickness was about 300 nm and they consisted of 20 double layers each of thickness 8 nm. X-ray diffraction was used for the characterization of sample microstucture, and surface profiler (alpha step) to determine the film thickness and surface roughness. Optical properties of the multilayers were investigated using spectroscopic ellipsometry and normal-incident reflectivity in the spectral range (1 - 14 eV) at room temperature and their temperature dependence using ellipsometry. The optical parameters of the Pt-coated substrates were fitted using the Drude model and then kept fixed in the subsequent calculation. In the transparent range the spectra were modeled by the Cauchy and Urbach formulas. Direct fit procedure and several models were applied to evaluate optical constants and film thickness.
    Trvalý link: http://hdl.handle.net/11104/0006268