Počet záznamů: 1
Prospects of the scanning low energy electron microscopy in materials science
0350665 - UPT-D 2011 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Mikmeková, Šárka - Hovorka, Miloš - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Prospects of the scanning low energy electron microscopy in materials science.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 37-38. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
Grant CEP: GA MŠk OE08012
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: scanning low energy electron microscopy * scanning electron microscopy * transmission electron microscopy * focused ion beam microscopy * cathode lens mode
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Various techniques exist which are capable of studying the material microstructure, with the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channeling, mostly in the Mott scattering angular range.
Trvalý link: http://hdl.handle.net/11104/0190605