Počet záznamů: 1

Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope

  1. 1.
    0340743 - UPT-D 2010 RIV JP eng J - Článek v odborném periodiku
    Pokorná, Zuzana - Frank, Luděk
    Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope.
    Materials Transactions. Roč. 51, č. 2 (2010), s. 214-218 ISSN 1345-9678
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: density of states * scanning low energy electron microscopy * aluminum * very-low-energy scanning electron microscopy * electron band structure
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    Impakt faktor: 0.779, rok: 2010
    http://www.jim.or.jp/journal/e/51/02/214.html

    Reflection of very slow electrons from solid surfaces has been reported to be inversely proportional to the local density of electronic states coupled to the incident electron wave. The reflected electron flux at units of eV used as the image signal in a scanning electron microscope allows mapping of the local density of states at high spatial resolution. Good performance of the microscope at very low energies is enabled by introducing the beam-retarding immersion lens (the cathode lens) with a biased specimen serving as the cathode. Results of demonstration experiments on aluminum are provided.
    Trvalý link: http://hdl.handle.net/11104/0183925