Počet záznamů: 1

Cathodoluminescence study of electron beam formed defects in polysilanes

  1. 1.
    0335270 - UPT-D 2010 RIV AT eng C - Konferenční příspěvek (zahraniční konf.)
    Schauer, P. - Schauer, Petr - Kuřitka, I. - Nešpůrek, Stanislav
    Cathodoluminescence study of electron beam formed defects in polysilanes.
    MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 3: 383-384. ISBN 978-3-85125-062-6.
    [MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
    Grant CEP: GA AV ČR IAA100100622
    Výzkumný záměr: CEZ:AV0Z20650511; CEZ:AV0Z40500505
    Klíčová slova: cathodoluminescence * electron beam degradation * poly[methyl(phenyl)silane] * PMPSi * silicon polymers
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    http://www.univie.ac.at/asem/Graz_MC_09/papers/55161.pdf http://www.univie.ac.at/asem/Graz_MC_09/papers/55161.pdf

    In materials science and semiconductor engineering, cathodoluminescence (CL) is a very efficient tool for the study of electronic substance structure and application possibilities. In spite of this, CL is only very rarely used for investigation of polymers. Recently Wellman et al introduced CL as an important tool for the investigation of materials for organic electroluminescence devices. It is evident that CL may become a strong tool for the investigation of polymer light emission possibilities as well as for investigation of triplet harvester organic solar cells. Our interest has been focused on the group of polysilanes (often also called polysilylanes), especially on poly[methyl(phenyl)silane] (PMPSi), having linear backbone of linked silicon atoms. Cathodoluminescence study of electron beam formed defects in PMPSi is presented in this paper.
    Trvalý link: http://hdl.handle.net/11104/0179779