Výsledky vyhledávání

  1. 1.
    0580709 - BC 2024 RIV GB eng A - Abstrakt
    Nebesářová, Jana - Ďurinová, Eva - Kitzberger, František - Skoupý, Radim - Týč, Jiří
    Comparison of Heavy Metal Distribution in Mouse Soft Tissue Samples Prepared for Serial Block Face SEM Using Different Protocols.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, JULY (2023), s. 1183-1184. ISSN 1431-9276. E-ISSN 1435-8115
    Institucionální podpora: RVO:60077344 ; RVO:68081731
    Klíčová slova: mouse * SEM * different protocols
    Obor OECD: Cell biology
    Způsob publikování: Open access
    https://academic.oup.com/mam/article/29/Supplement_1/1183/7228840?login=true
    Trvalý link: https://hdl.handle.net/11104/0352395
     
     
  2. 2.
    0575442 - ÚPT 2024 GB eng A - Abstrakt
    Hotz, M. T. - Martis, J. - Radlička, Tomáš - Bacon, N. J. - Dellby, N. - Lovejoy, T. C. - Quillin, S. C. - Hwang, H. Y. - Singh, P. - Křivánek, O. L.
    Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2064-2065. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Institucionální podpora: RVO:68081731
    https://academic.oup.com/mam/article/29/Supplement_1/2064/7228064
    Trvalý link: https://hdl.handle.net/11104/0345233
     
     
  3. 3.
    0575427 - ÚPT 2024 RIV GB eng A - Abstrakt
    Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
    Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Grant CEP: GA ČR(CZ) GA22-34286S
    Grant ostatní: AV ČR(CZ) StrategieAV21/26
    Program: StrategieAV
    Institucionální podpora: RVO:68081731
    Klíčová slova: scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
    Obor OECD: Electrical and electronic engineering
    https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
    Trvalý link: https://hdl.handle.net/11104/0345212
     
     
  4. 4.
    0575395 - ÚPT 2024 GB eng A - Abstrakt
    Hrubanová, Kamila - Sikorová, Pavlína - Mrázová, Kateřina - Nebesářová, Jana - Obruča, S. - Krzyžánek, Vladislav
    Morphological Study of PHA Producing Bacteria.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 883-884. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Grant CEP: GA MŠMT(CZ) LM2023050
    Grant ostatní: AV ČR(CZ) MSM100652102
    Program: Program na podporu mezinárodní spolupráce začínajících výzkumných pracovníků
    Institucionální podpora: RVO:68081731 ; RVO:60077344
    https://academic.oup.com/mam/article/29/Supplement_1/883/7228824
    Trvalý link: https://hdl.handle.net/11104/0345203
     
     
  5. 5.
    0575394 - ÚPT 2024 GB eng A - Abstrakt
    Krzyžánek, Vladislav - Šlouf, Miroslav - Skoupý, Radim - Pavlova, Ewa - Hrubanová, Kamila
    Powder Nano-Beam Diffraction in Scanning Electron Microscopy: Possibilities and Limitations for Applications.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 328-329. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Grant CEP: GA ČR(CZ) GA21-13541S; GA TA ČR(CZ) TN02000020
    Institucionální podpora: RVO:68081731 ; RVO:61389013
    https://academic.oup.com/mam/article/29/Supplement_1/328/7228371
    Trvalý link: https://hdl.handle.net/11104/0345202
     
     
  6. 6.
    0575309 - ÚPT 2024 GB eng A - Abstrakt
    Ambrož, Ondřej - Jozefovič, Patrik - Čermák, Jan - Mikmeková, Šárka
    Effect of Metallographic Pretreatment of TRIP Steel Specimens on Correlative Imaging and Electron Backscatter Diffraction Analysis.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2023-2025. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Grant CEP: GA TA ČR(CZ) TN02000020
    Grant ostatní: AV ČR(CZ) LQ100652201
    Program: Prémie Lumina quaeruntur
    Institucionální podpora: RVO:68081731
    Klíčová slova: metallographic pretreatment * TRIP steel * correlative microscopy * EBSD
    Obor OECD: Materials engineering
    https://academic.oup.com/mam/article/29/Supplement_1/2023/7228093
    Trvalý link: https://hdl.handle.net/11104/0345092
     
     
  7. 7.
    0575308 - ÚPT 2024 GB eng A - Abstrakt
    Čermák, Jan - Ambrož, Ondřej - Zouhar, Martin - Jozefovič, Patrik - Mikmeková, Šárka
    Methodology for Collecting and Aligning Correlative SEM, CLSM and LOM Images of Bulk Material Microstructure to Create a Large Machine Learning Training Dataset.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2016-2018. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Grant CEP: GA TA ČR(CZ) TN02000020
    Grant ostatní: AV ČR(CZ) LQ100652201
    Program: Prémie Lumina quaeruntur
    Institucionální podpora: RVO:68081731
    Klíčová slova: correlative microscopy * metalography * specimen navigation * image registration * machine learning dataset
    Obor OECD: Materials engineering
    https://academic.oup.com/mam/article/29/Supplement_1/2016/7228070
    Trvalý link: https://hdl.handle.net/11104/0345091
     
     
  8. 8.
    0575302 - ÚPT 2024 GB eng A - Abstrakt
    Jozefovič, Patrik - Ambrož, Ondřej - Čermák, Jan - Man, Jiří - Mikmeková, Šárka
    A Comparison of Image Analysis Tools for Segmentation on SEM Micrographs - Zeiss ZEN Intellesis vs. Thermofisher AVIZO.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1889-1891. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    Grant ostatní: AV ČR(CZ) LQ100652201
    Program: Prémie Lumina quaeruntur
    Institucionální podpora: RVO:68081731 ; RVO:68081723
    Klíčová slova: machine learning * image analysis * segmentation * metalography * scanning electron microscopy
    Obor OECD: Materials engineering
    https://academic.oup.com/mam/article/29/Supplement_1/1889/7228906
    Trvalý link: https://hdl.handle.net/11104/0345089
     
     
  9. 9.
    0571040 - ÚPT 2024 GB eng A - Abstrakt
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna Mikmeková, Eliška
    Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 28, S1 (2022), s. 2432-2434. ISSN 1431-9276. E-ISSN 1435-8115
    Grant CEP: GA TA ČR(CZ) TN01000008
    Grant ostatní: AV ČR(CZ) StrategieAV21/26
    Program: StrategieAV
    Institucionální podpora: RVO:68081731
    Obor OECD: Electrical and electronic engineering
    https://academic.oup.com/mam/article/28/S1/2432/6997288
    Trvalý link: https://hdl.handle.net/11104/0342355
     
     
  10. 10.
    0566515 - FZÚ 2023 RIV US eng A - Abstrakt
    Klimša, Ladislav - Duchoň, Jan - Svora, Petr - Kopeček, Jaromír
    Possible approaches for combined use of xenon and gallium ion sources for task specific focused ion beam sample preparation.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 28, č. 1 (2022), s. 26-27. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2022. 31.07.2022-04.08.2022, Portland]
    Grant CEP: GA MŠMT LM2018110
    Institucionální podpora: RVO:68378271
    Klíčová slova: FIB-SEM * plasma FIB-SEM
    Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
    Trvalý link: https://hdl.handle.net/11104/0337838
     
     

  Tyto stránky využívají soubory cookies, které usnadňují jejich prohlížení. Další informace o tom jak používáme cookies.