Výsledky vyhledávání
- 1.0574102 - ÚPT 2024 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Burda, Daniel - Allaham, Mohammad M. - Horáček, Miroslav - Knápek, A.
Study of Dielectric Nanolayers and Multilayer Coated Emitters.
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2023, s. 53-54. ISBN 979-8-3503-0143-4. ISSN 2164-2370.
[International Vacuum Nanoelectronics Conference (IVNC) /36./. Cambridge, MA (US), 10.07.2023-13.07.2023]
Výzkumná infrastruktura: CzechNanoLab II - 90251
Institucionální podpora: RVO:68081731
Klíčová slova: Cold Field Emission * Multilayer Dielectric Structure * Tungsten Tips * Electron Tunneling * Atomic Layer Deposition
Obor OECD: Materials engineering
https://ieeexplore.ieee.org/document/10188949
Trvalý link: https://hdl.handle.net/11104/0344865 - 2.0554502 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Mousa, M. S. - Burda, Daniel - AlSa'eed, M. - AlJrawen, S. - Knápek, Alexandr … celkem 8 autorů
Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 151-152. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: Field electron emission * Murphy-Good plots * Molybdenum Single tip field emitter * Orthodoxy test limits * kinked field emission characteristics
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600771
Trvalý link: http://hdl.handle.net/11104/0329217 - 3.0554500 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Burda, Daniel - Allaham, Mohammad M. - Knápek, Alexandr - Sobola, Dinara - Mousa, M. S. … celkem 7 autorů
Field emission properties of sharp tungsten cathodes coated with a thin resilient oxide barrier.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 178-179. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Výzkumná infrastruktura: CzechNanoLab - 90110
Institucionální podpora: RVO:68081731
Klíčová slova: field electron microscopy * electrochemical etching * tungsten single tip field emitter * atomic layer deposition * Al2O3 nanolayer * Murphy-Good plot
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600704
Trvalý link: http://hdl.handle.net/11104/0329215 - 4.0553256 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Buchner, P. - Schreiner, R. - Knápek, A. … celkem 6 autorů
Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 140-141. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: Silicon field emission tips * Murphy-Good plot * electron collection efficiency * array characterization parameters * Silicon field enhancement factor
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600690
Trvalý link: http://hdl.handle.net/11104/0328237 - 5.0553018 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Knápek, Alexandr - Mousa, M. S. - Forbes, R. G.
User-friendly method for testing field electron emission data: Technical report.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 138-139. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: field emission analysis tool * Murphy-Good plot * voltage conversion length * field enhancement factor * formal emission area * formal area efficiency
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600769
Trvalý link: http://hdl.handle.net/11104/0328068