Výsledky vyhledávání
- 1.0575394 - ÚPT 2024 GB eng A - Abstrakt
Krzyžánek, Vladislav - Šlouf, Miroslav - Skoupý, Radim - Pavlova, Ewa - Hrubanová, Kamila
Powder Nano-Beam Diffraction in Scanning Electron Microscopy: Possibilities and Limitations for Applications.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 328-329. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Grant CEP: GA ČR(CZ) GA21-13541S; GA TA ČR(CZ) TN02000020
Institucionální podpora: RVO:68081731 ; RVO:61389013
https://academic.oup.com/mam/article/29/Supplement_1/328/7228371
Trvalý link: https://hdl.handle.net/11104/0345202 - 2.0568572 - ÚPT 2023 CZ eng A - Abstrakt
Šlouf, Miroslav - Skoupý, Radim - Pavlova, Ewa - Krzyžánek, Vladislav
High-resolution Powder Nano-Beam Diffraction in Scanning Electron Microscopy.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 76-77. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant CEP: GA TA ČR(CZ) TN01000008; GA ČR(CZ) GA21-13541S
Institucionální podpora: RVO:68081731 ; RVO:61389013
Klíčová slova: SEM * Powder NanoBeam Diffraction
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Trvalý link: https://hdl.handle.net/11104/0339862