Výsledky vyhledávání
- 1.0564672 - ÚPT 2023 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Horáček, Miroslav - Krátký, Stanislav - Matějka, Milan - Chlumská, Jana - Meluzín, Petr - Pirunčík, J. - Aubrecht, I. - Kotrlý, M. - Kolařík, Vladimír
A sampler of diffraction and refraction optically variable image elements.
NANOCON 2021 - Conference proceedings. Ostrava: Tanger Ltd., 2021, s. 436-441. ISBN 978-80-88365-00-6. ISSN 2694-930X.
[International Conference on Nanomaterials - Research & Application /13./ NANOCON. Brno (CZ), 20.10.2021-22.10.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: diffraction * refraction * e-beam writer * embossing * galvanic replication * mastering * optically variable image element * security * valuables
Obor OECD: Nano-processes (applications on nano-scale)
https://www.confer.cz/nanocon/2021/4371-a-sampler-of-diffraction-and-refraction-optically-variable-image-elements
Trvalý link: https://hdl.handle.net/11104/0336321 - 2.0554502 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Mousa, M. S. - Burda, Daniel - AlSa'eed, M. - AlJrawen, S. - Knápek, Alexandr … celkem 8 autorů
Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 151-152. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: Field electron emission * Murphy-Good plots * Molybdenum Single tip field emitter * Orthodoxy test limits * kinked field emission characteristics
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600771
Trvalý link: http://hdl.handle.net/11104/0329217 - 3.0554500 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Burda, Daniel - Allaham, Mohammad M. - Knápek, Alexandr - Sobola, Dinara - Mousa, M. S. … celkem 7 autorů
Field emission properties of sharp tungsten cathodes coated with a thin resilient oxide barrier.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 178-179. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Výzkumná infrastruktura: CzechNanoLab - 90110
Institucionální podpora: RVO:68081731
Klíčová slova: field electron microscopy * electrochemical etching * tungsten single tip field emitter * atomic layer deposition * Al2O3 nanolayer * Murphy-Good plot
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600704
Trvalý link: http://hdl.handle.net/11104/0329215 - 4.0553256 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Buchner, P. - Schreiner, R. - Knápek, A. … celkem 6 autorů
Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 140-141. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: Silicon field emission tips * Murphy-Good plot * electron collection efficiency * array characterization parameters * Silicon field enhancement factor
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600690
Trvalý link: http://hdl.handle.net/11104/0328237 - 5.0553018 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Knápek, Alexandr - Mousa, M. S. - Forbes, R. G.
User-friendly method for testing field electron emission data: Technical report.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 138-139. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: field emission analysis tool * Murphy-Good plot * voltage conversion length * field enhancement factor * formal emission area * formal area efficiency
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600769
Trvalý link: http://hdl.handle.net/11104/0328068