Výsledky vyhledávání

  1. 1.
    0567515 - ÚPT 2023 CZ eng A - Abstrakt
    Piňos, Jakub - Frank, Luděk
    Real Time Observation of strain in the SEM copper sample.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 351-352. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    Grant ostatní: AV ČR(CZ) StrategieAV21/26
    Program: StrategieAV
    Institucionální podpora: RVO:68081731
    Klíčová slova: SEM * SLEEM * deformation
    Obor OECD: Materials engineering
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Trvalý link: https://hdl.handle.net/11104/0338768

               
     
     
  2. 2.
    0552272 - ÚPT 2022 CZ eng A - Abstrakt
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Grant ostatní: AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institucionální podpora: RVO:68081731
    Klíčová slova: time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
    Obor OECD: Electrical and electronic engineering
    https://ava2016-autumn.webnode.cz/
    Trvalý link: http://hdl.handle.net/11104/0327405

               
     
     
  3. 3.
    0551131 - ÚPT 2022 RIV US eng A - Abstrakt
    Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
    Institucionální podpora: RVO:68081731
    Klíčová slova: time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
    Obor OECD: Electrical and electronic engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
    Trvalý link: http://hdl.handle.net/11104/0326576

               
     
     
  4. 4.
    0536979 - ÚPT 2021 CZ eng A - Abstrakt
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    Grant CEP: GA TA ČR(CZ) TN01000008
    Institucionální podpora: RVO:68081731
    Klíčová slova: electron scattering phenomena
    Obor OECD: Electrical and electronic engineering
    Trvalý link: http://hdl.handle.net/11104/0314731

               
     
     
  5. 5.
    0519852 - ÚPT 2020 RS eng A - Abstrakt
    Müllerová, Ilona - Daniel, Benjamin - Konvalina, Ivo - Frank, Luděk - Materna-Mikmeková, Eliška
    Advanced techniques for low- and very-low energy SEM using reflected and transmitted signals.
    MCM 2019. 14th Multinational Congress on Microscopy. Proceedings. Belgrade: University of Belgrade, 2019. s. 98-99. ISBN 978-86-80335-11-7.
    [Multinational Congress on Microscopy /14./. 15.09.2019-20.09.2019, Belgrade]
    Grant CEP: GA TA ČR(CZ) TE01020118
    Institucionální podpora: RVO:68081731
    Klíčová slova: very-low energy electron microscopy * very-low energy electron microscopy
    Obor OECD: Electrical and electronic engineering
    Trvalý link: http://hdl.handle.net/11104/0304834

               
     
     
  6. 6.
    0510315 - ÚPT 2020 DE eng A - Abstrakt
    Daniel, Benjamin - Zouhar, Martin - Radlička, Tomáš - Piňos, Jakub - Materna-Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
    Very Low Energy Electron Transmission Spectro-Microscopy.
    Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 609-610.
    [Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
    Grant CEP: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
    Institucionální podpora: RVO:68081731
    Klíčová slova: very low energy * electron transmission spectro-microscopy
    Obor OECD: Electrical and electronic engineering
    https://www.microscopy-conference.de
    Trvalý link: http://hdl.handle.net/11104/0300821

               
     
     
  7. 7.
    0510308 - ÚPT 2020 US eng A - Abstrakt
    Materna-Mikmeková, Eliška - Frank, Luděk - Konvalina, Ivo - Müllerová, Ilona - Zhang, T. - Asefa, T.
    Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 500-501. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    Grant CEP: GA TA ČR(CZ) TN01000008; GA TA ČR TG03010046
    Institucionální podpora: RVO:68081731
    Klíčová slova: ultra-low energy * spectroscopy * contamination mitigation strategy
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0300817

               
     
     
  8. 8.
    0510307 - ÚPT 2020 US eng A - Abstrakt
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 482-483. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    Grant CEP: GA TA ČR(CZ) TN01000008
    Institucionální podpora: RVO:68081731
    Klíčová slova: two-dimensional (2D) materials * microscopy and spectroscopy * low energy electrons
    Obor OECD: Electrical and electronic engineering
    Trvalý link: http://hdl.handle.net/11104/0300816

               
     
     
  9. 9.
    0501304 - ÚPT 2019 GB eng A - Abstrakt
    Frank, Luděk
    Carbon overlayer from hydrocarbon precursors: Electron-beam-induced deposition/removal.
    16th International Conference on Emerging Materials and Nanotechnology. Proceedings. Vol. S7. London: Omics International, 2018. s. 54. ISSN 2169-0022.
    [International Conference on Emerging Materials and Nanotechnology /16./. 22.03.2018-23.03.2018, London]
    Institucionální podpora: RVO:68081731
    Klíčová slova: Electron-beam-induced * carbon overlayer
    Obor OECD: Nano-processes (applications on nano-scale)
    Trvalý link: http://hdl.handle.net/11104/0293293

               
     
     
  10. 10.
    0501301 - ÚPT 2019 GB eng A - Abstrakt
    Frank, Luděk - Mikmeková, Eliška
    Ultra-low energy SEM/STEM of graphene.
    19th World Congress on Material Science and Engineering. Proceedings. Vol. S7. London: Omics International, 2018. s. 141-142. ISSN 2169-0022.
    [World Congress on Materials Science and Engineering /19./. 11.06.2018-13.06.2018, Barcelona]
    Institucionální podpora: RVO:68081731
    Klíčová slova: ultra-low energy * SEM * STEM * graphene
    Obor OECD: Nano-materials (production and properties)
    Trvalý link: http://hdl.handle.net/11104/0293291

               
     
     

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