Výsledky vyhledávání
- 1.0204951 - UPT-D 970085 DE eng A - Abstrakt
Srnánek, R. - Škriniarová, J. - Kováč, J. - Frank, Luděk - Novotný, I. - Hotový, I. - Gottschalch, V.
Efect Recognition in Semiconductor Heterostructures on Bevelled Surface.
Abstracts of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors DRIP VII. Berlin: Institute of Crystal Growth, 1997. s. 10.8.
[DRIP /7./. 07.09.1997-10.09.1997, Templin]
Trvalý link: http://hdl.handle.net/11104/0100571 - 2.0204950 - UPT-D 970084 SK eng A - Abstrakt
Srnánek, R. - Kováč, J. - Fesic, V. - Frank, Luděk - Liday, J. - Vogrincic, P. - Novotný, I. - Hotový, I. - Buc, D.
Characterization of III-V Semiconductor Heterostructure on Bevelled Surface.
3rd International Workshop on Heterostructure Epitaxy and Devices HEAD '97. Bratislava: Institute of Electrical Engineering, Slovak Academy of Sciences, 1997. s. P10.
[HEAD '97 /3./. 12.10.1997-16.10.1997, Smolenice]
Trvalý link: http://hdl.handle.net/11104/0100570