Výsledky vyhledávání
- 1.0521571 - ÚPT 2020 RS eng A - Abstrakt
Skoupý, Radim - Krzyžánek, Vladislav
Assessing the thickness error rate of quantitative STEM measurements.
MCM 2019. 14th Multinational Congress on Microscopy. Proceedings. Belgrade: University of Belgrade, 2019. s. 107-109. ISBN 978-86-80335-11-7.
[Multinational Congress on Microscopy /14./. 15.09.2019-20.09.2019, Belgrade]
Grant CEP: GA ČR GA17-15451S; GA MPO(CZ) FV30271; GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: qSTEM * BSE signal
Obor OECD: Nano-materials (production and properties)
Trvalý link: http://hdl.handle.net/11104/0306173 - 2.0519852 - ÚPT 2020 RS eng A - Abstrakt
Müllerová, Ilona - Daniel, Benjamin - Konvalina, Ivo - Frank, Luděk - Materna Mikmeková, Eliška
Advanced techniques for low- and very-low energy SEM using reflected and transmitted signals.
MCM 2019. 14th Multinational Congress on Microscopy. Proceedings. Belgrade: University of Belgrade, 2019. s. 98-99. ISBN 978-86-80335-11-7.
[Multinational Congress on Microscopy /14./. 15.09.2019-20.09.2019, Belgrade]
Grant CEP: GA TA ČR(CZ) TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: very-low energy electron microscopy * very-low energy electron microscopy
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0304834