Výsledky vyhledávání
- 1.0575427 - ÚPT 2024 RIV GB eng A - Abstrakt
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Grant CEP: GA ČR(CZ) GA22-34286S
Grant ostatní: AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institucionální podpora: RVO:68081731
Klíčová slova: scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
Obor OECD: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Trvalý link: https://hdl.handle.net/11104/0345212 - 2.0571040 - ÚPT 2024 GB eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies.
Microscopy and Microanalysis. Cambridge University Press. Roč. 28, S1 (2022), s. 2432-2434. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA TA ČR(CZ) TN01000008
Grant ostatní: AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institucionální podpora: RVO:68081731
Obor OECD: Electrical and electronic engineering
https://academic.oup.com/mam/article/28/S1/2432/6997288
Trvalý link: https://hdl.handle.net/11104/0342355 - 3.0568495 - ÚPT 2023 RIV CZ eng A - Abstract
Průcha, Lukáš - Lejeune, M. - Kizovský, Martin - Materna Mikmeková, Eliška
Combining Low Energy Electron Microscopy and Thermal Raman Spectroscopy for Graphene Analysis.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 166-167. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : graphene * SLEEM * Raman Spectroscopy
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0339795 - 4.0568482 - ÚPT 2023 RIV CZ eng A - Abstract
Paták, Aleš - Zouhar, Martin - Konvalina, Ivo - Materna Mikmeková, Eliška - Průcha, Lukáš - Müllerová, Ilona - Charvátová Campbell, A.
Ab initio study of angle-resolved electron spectroscopy of graphene.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 156-157. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : density-functional theory * low-energy electron microscopy * many-body perturbation theory
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0339786 - 5.0568413 - ÚPT 2024 RIV CZ eng A - Abstract
Lalinský, Ondřej - Průcha, Lukáš - Skoupý, R.
Graphene-coated scintillators for low-energy electron detection.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 444-445. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008; GA MPO(CZ) FV30271
Institutional support: RVO:68081731
Keywords : graphene * cathodoluminescence efficiency * scintillation detector * low energy
OECD category: Coating and films
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0339730 - 6.0567516 - ÚPT 2023 RIV CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna Mikmeková, Eliška
Time-of-Flight Spectrometer for Low Landing Energies.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338771 - 7.0552272 - ÚPT 2022 CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
OECD category: Electrical and electronic engineering
https://ava2016-autumn.webnode.cz/
Permanent Link: http://hdl.handle.net/11104/0327405 - 8.0517435 - ÚPT 2020 PT eng A - Abstract
Průcha, Lukáš - Piňos, Jakub - Kizovský, Martin - Mikmeková, Eliška
Graphene surface analysis and layer counting using scanning low energy electron microscopy.
5th Edition of the European Graphene Forum 2019. Book of Abstracts. Lisbon: SETCOR, 2019.
[Edition of the European Graphene Forum 2019 /5./. 23.10.2019-25.10.2019, Lisbon]
Institutional support: RVO:68081731
Keywords : graphene analysis * low energy electron microscopy * scanning electron microscopy * layer counting
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0302742