Výsledky vyhledávání
- 1.0456254 - ÚPT 2016 CZ eng A - Abstrakt
Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Experiments and simulations of electron transport in materials.
Mikroskopie 2015. Praha: Československá mikroskopická společnost, 2015. s. 23-24.
[Mikroskopie 2015. 12.05.2015-13.05.2015, Lednice]
Grant CEP: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: electron transport in materials
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0256812 - 2.0452656 - ÚPT 2016 AT eng A - Abstrakt
Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Experiment-Simulation comparison of the transmission of electrons through thin films in an SEM with a STEM Detector.
Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). Vienna: IAP, 2015. s. 45.
[Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). 07.09.2015-11.09.2015, Herstein]
Grant CEP: GA MŠMT(CZ) LO1212
Institucionální podpora: RVO:68081731
Klíčová slova: SEM * STEM detector * Monte-Carlo simulations
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0257883 - 3.0452633 - ÚPT 2016 TH eng A - Abstrakt
Müllerová, Ilona - Frank, Luděk - Konvalina, Ivo - Matsuda, K. - Mikmeková, Eliška - Pokorná, Zuzana - Walker, Christopher
Low Energy Electron Microscopy in Materials Science.
10th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT). Abstracts and Proceedings. Chiang Mai: Chiang Mai University, 2015. s. 20.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /10./. 17.11.2015-21.11.2015, Chiang Mai]
Grant CEP: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institucionální podpora: RVO:68081731
Klíčová slova: low energy electrons * contrast in scanning electron microscope * transmission mode in SEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0253577 - 4.0431334 - ÚPT 2015 CZ eng A - Abstrakt
Mika, Filip - Konvalina, Ivo - Walker, Christopher
Imaging with STEM detector, experiments vs. simulation.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 64. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Grant CEP: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: STEM * Monte-Carlo simulations * transmitted electrons
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236395