Výsledky vyhledávání
- 1.0510317 - ÚPT 2020 DE eng A - Abstrakt
Zouhar, Martin - Daniel, Benjamin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Simulation of optimal measurement setting and calibration of a novel time-offlight spectrometer.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 603-604.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
Grant CEP: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: measurement setting and calibration * novel time-offlight
Obor OECD: Electrical and electronic engineering
https://www.microscopy-conference.de
Trvalý link: http://hdl.handle.net/11104/0300825 - 2.0431338 - ÚPT 2015 CZ eng A - Abstrakt
Neděla, Vilém - Konvalina, Ivo - Oral, Martin
Simulation of energy distribution of signal electrons detected by the segmental ionization detector in high pressure conditions of ESEM.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 97. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Grant CEP: GA ČR(CZ) GA14-22777S
Institucionální podpora: RVO:68081731
Klíčová slova: ESEM * detection system * EOD * Geant
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236399 - 3.0431337 - ÚPT 2015 CZ eng A - Abstrakt
Zelinka, Jiří - Oral, Martin - Radlička, Tomáš
Simulation of space charge effects in electron optical systems based on the calculation of current density.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 91. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Institucionální podpora: RVO:68081731
Klíčová slova: space charge * current density evaluation * self-consistent computation * remeshing * FEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236398 - 4.0431330 - ÚPT 2015 CZ eng A - Abstrakt
Oral, Martin - Neděla, Vilém
Dynamic Correction of Higher Order Deflection Aberrations in the Environmental SEM.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 3. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
Grant CEP: GA ČR(CZ) GA14-22777S
Institucionální podpora: RVO:68081731
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0236390 - 5.0352427 - ÚPT 2011 SG eng A - Abstrakt
Oral, Martin - Lencová, Bohumila
Correction of sample tilt in FIB instruments.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 75-76.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
Grant CEP: GA AV ČR IAA100650805
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: particle optical instruments * elliptical spot * astigmatic focusing * optimization computation
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0191934